NanoScope gave an Online invited Tutorial on behalf of IMAPS UK on the 18th September 2020 on the subject of Focused Ion Beam (FIB) Circuit Nano-Surgery and Failure Analysis from Board to Gate. The Tutorial Archives can be accessed here. This presentation included a comparison of Cross Sectioning techniques with a comparison of the benefits and limitations of each method. Conventional Mechanical sectioning (with extended capabilities) vs FIB micro-sectioning vs Plasma FIB Sectioning. Also included was an introduction to the techniques of Silicon IC Circuit Nano-Surgery and other IC specific techniques that are now becoming possible to perform on package substrates, system boards, complex packages and other novel die mounting...
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